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Test Features that come standard with all TestStation models:

Standard Features
Test Features that come standard with all TestStation models:

Windows-based PC Controller for high-performance communication with the test instruments and maximum test throughput
Shorts/Opens Drivers which utilize both linear and binary detection algorithms to quickly and accurately diagnose short and open defects
Analog Subsystem capable of performing precise measurements of Resistors, Capacitors, Inductors, Diodes, Transistors, FET’s, Opamps and Rectifiers
High-Voltage Source and Measurement Instruments capable of sourcing 120V and measuring up to 200V
Arbitrary Waveform Generator capable of sourcing sine, square, triangle or complex user-defined waveforms
Digital Voltmeter/Digitizer instrument that can be configured as a sampling scope to capture on board signals
Synchronized Analog & Digital Subsystems for performing coherent measurements of mixed-signal devices
Eight Channel Instrument Multiplexer and High Performance Pin Scanner matrix allows any instrument or tester pin to be routed to any one of eight measurement channels
Junction Xpress vectorless test technique which is capable of detecting open device pins and marginal solder joints on digital ICs by applying AC signals and measuring harmonic frequencies at diode junctions
IEEE-488 Instrument Bus with nine external ports for connecting external GPIB compatible instruments to the tester internal instrument bus
Calibration Standards and self-test circuits built into the tester for reliable system verification procedures
User-Level Programmable Relay Drivers support switching in external circuits and fixture hardware
High-Level Programming Language allows programmers to quickly create custom test procedures and modify existing test sequences
TestStation Pro Software Suite includes TestStation Debug Pro and Production Pro software environments with built-in productivity tools for accelerating program debug and maximizing production efficiency
AutoFLASH and ISP Toolset supports automatic generation of test vector models for Programmable Logic Devices
Data Logging and Data Display software for powerful analysis of test and production measurement data
Options
Features available as TestStation system Options:

Design-to-Build (D2B) software framework simplifies CAD preparation, program preparation, and fixture assembly activities
Smart4Metrics, Teradyne’s smart factory solution connects in-circuit tester status and health data with your existing data collection system
Framescan FX Vectorless Test software and hardware detect open pins on devices and connectors using a simple unpowered capacitive measurement technique
BasicSCAN boundary scan test model generation software automatically generates digital test vector models for boundary scan device pins that have physical test access
Scan Pathfinder comprehensive boundary scan test generation and diagnostic software for detecting faults on boundary scan boards with limited test access
Powered Framescan combines the vectorless test capabilities of Framescan with the built-in control capabilities of boundary scan to detect opens on connector and device pins that do not have physical test access
Dynamic Programming Extension software allows bidirectional communication between external software applications and the TestStation runtime using the Dynamic Library Link (DLL) communication standard
User Power Supplies can be installed to power the board under test and can be configured to obtain voltages up to 300V or currents up to 28 amps
Ultra Pin II Pin Boards are available in a number of different configurations (analog only, pure-pin, hybrid, and high density) to match manufacturers test accuracy. The UltraPin II Driver/Sensor pins boast 15mV test accuracy, per pin programmable logic voltages, automatic driver verification, backdrive monitoring and control, dual logic thresholds and programmable slew rates. Specialized digital subsystem timing controls ensure precision application of digital vectors and innovative data compression techniques (timing sets, nested loops, subroutines, data tables, data import & export, and CRC calculation) support application of long vector streams.
Clock Drive, Clock Sense, and Trigger (CST) signal pins can operate at speeds up to 20MHz and are synchronized with the D/S pins to simplify the development of test vectors of Flash, ISP, boundary scan, and complex digital components
Deep Serial Memory can be used to extend the memory behind the digital pins from 64K up to 1Gig and is useful in test applications like PLD programming and boundary scan that may require very long streams of data
System Frequency/Time Measurement (SFTM) instrument offers the capability to measure time-related events (frequency, period, time, interval, ratio, count, duty cycle and pulse width) on the board under test
Multi-Function Application Board permits interfacing of application specific hardware directly into the test system and provides a high-fidelity path for connecting the custom circuitry to the board under test
PXI Functional Expansion Board supports adding four compact PXI instruments to the test system – thereby expanding the functional test capabilities of the tester

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