BT-BASIC commands used

Features

The Features task (Figure 3-5) defines the target test system. It lets you specify what features or licenses to enable for the board test. The ScanWorks area below the Features table indicates whether a ScanWorks licence file was found. Contact your Agilent sales representative to purchase optional system features.

Importing data

If this test development targets a known configuration, you can import the configuration data. Use the browse button () to locate and select the configuration template to import. The configuration data from the selected template will be applied to all the Target Configuration subtasks.

		Configuration templates are created in the Finalize Target Configuration task.

Selecting the features

1   Select the features to enable for use in testing the board. Table 3-1 describes the features.

2   Click Save Board Configuration.

Table 3-1    Feature Selection 

Option	Description
Express Fixturing	Express technology involves a single plane fixture with personality pins for short fixture wires.
Multiple Board Versions	Use this feature to develop and maintain one test and fixture for multiple versions of a PC board. This is useful when an Engineering Change Order (ECO) is applied to a board and you still need to support the previous version of the board in test. This is also useful if you have a common blank PC board that can be loaded with different configurations of devices. For additional information, see Developing Multiple Board Version Tests.
Polarity Check	Agilent Polarity Check automatically tests the orientation (polarity) of electrolytic capacitors on the board under test. This unpowered test detects reversed capacitors before they can fail and possibly damage the board or cause safety hazards. For additional information, see Developing Polarity Check Tests.
Throughput Multiplier	Agilent Throughput Multiplier reduces test time by testing up to four boards of a single-board-type panel simultaneously. You must use Throughput Multiplier with Panel Test; you can use Throughput Multiplier with Dual-Well Shared Wiring. For additional information, see Developing Multiple-Board Tests.
Drive Thru	The Drive Thru test allows you to use VTEP technology to test devices through series components, such as resistors, capacitors, and inductors. Drive Thru extends the capabilities of VTEP by providing a means to test integrated circuits and/or connectors when there is no access directly on the device under test. For additional information, see Using DriveThru Tests.
Silicon Nails	The test development software can perform Silicon Nails tests on non-Boundary-Scan devices by generating an ITL file (containing all vectors needed) that can be used to test a digital device using a combination of physical nails and Silicon Nails. A Silicon Nails test uses the Boundary Register cells instead of physical probes or nodes. For details, see Boundary-Scan Testing.
Flash ISP	Flash ISP (In-System Programming) is an optional software product that significantly improves flash programming speeds. It does so through the use of the Flash ISP algorithm, and through the hardware functionality of the ControlXTP card. For details, see Flash Programming.
1149.6 Boundary Scan	Enables 1149.6 interconnect testing. For details, see Boundary-Scan Testing.
Cover-Extend	Enables Cover-Extend. To use this test method, the Advanced Boundary Scan option must also be enabled. For additional information, see Developing VTEP/TestJet and CET Tests.
Advanced Probe Spacing	This feature allows closer spacing on probes, thus using fewer 50 mil probes. Note: Ensure the fixture vendor can utilize the smaller spacing.
Aware Test	(This option is no longer supported.)
Panel Test	This feature allows you to develop board tests and fixtures for multiple-board panels. It increases test speed by eliminating redundant tasks associated with testing boards in a panel. For additional information, see Developing Multiple-Board Tests.
Dual Well Shared Wiring	This feature is used to develop a dual-well fixture that has parallel wiring. Dual Well fixturing helps to eliminate handling time on high-volume lines. See Developing Multiple-Board Tests for information about panel testing.
Advanced Boundary Scan	The Agilent Boundary-Scan software supports the testing of digital devices that comply with IEEE Standard 1149.1. For details, see Boundary-Scan Testing.
Flash70	Flash70 is an optional software product that improves flash programming time. Flash70 features include faster programming speed with the Flash70 algorithm and new library models to simplify flash test development. For details, see the Flash Programming.
PLD ISP	The test development software can be used to program IEEE 1149.1 Standard-compliant (boundary-scan) logic devices using the test access port (TAP). See PLD In-System Programming.
Advanced Boundary Scan Differential	The additional keyword differential enables testing of differential DC on the boundary scan devices.
ASRU Speedup	(ASRU-N only) Instructs IPG to add the ASRU speedup (as) option to applicable tests during test genaration. During execution, the Digitized Measurement Circuit (DMC) on the ASRU-N card is used to accelerate the test time. See Using the ASRU Speedup Feature in Analog Testing.
Vectorless Test Technique:
Vectorless Test EP	Agilent Vectorless Test EP (VTEP) tests for manufacturing defects such as open connections, missing devices, and improperly positioned (skewed) devices.
TestJet Test	Agilent TestJet is the older version of VTEP. Be sure to select the version that matches your hardware. For information about VTEP and TestJet testing, see Developing VTEP/TestJet and CET Tests.

Figure 3-5    Configuration > Target Configuration > Features